Scanning immunoelectron microscopy of antigenic alterations of MDCK cells after infection with influenza virus.

Now in its 30th year of designing electron microscopes. JEOL is still searching after its ma|or theme Higher resolution capability The JEM-200CX electron microscope and the JSM-F15 field emission scanning microscope are two of our latest developments born out of such continued research. They are now winning broad acceptance as a topnotch TEM and SEM. in many respects such as resolution, stability and ease of operation O A top entry goniometer allowing for Cs= 1 2mm and ± 10° tilt is attachable O A eucentric side entry goniometer assurng ±30* tilt and 0 14 nm resolution is standard. Resolution* • 0 14nm(1 4A. lattice image). 0 26nm(2.6A, point image) guaranteed Accelerating voltage • 80, 100. 120. 160. 200 kV. Magnification* 100X-750.000X. o Employs a cartridge type FE gun O A clean ultrahigh vacuum provided by a fully automated oil-free evacuation system. Resolution 3 nm (30A) guaranteed. Accelerating voltage 15kV Magnification : 60X-300.000X (for observation).